论文标题
出现对称对称性受保护的拓扑阶段，仅在空间调谐的测量电路中
Emergence symmetry protected topological phase in spatially tuned measurement-only circuit
论文作者
论文摘要
在仅测量电路中研究了由空间调整的单位点测量引起的拓扑相变，其中三种不同类型的投影测量算子。三个测量操作员之间的特定空间设置和换向关系的组合产生了这样的过渡。在实践中，通过在奇数sublattice上应用另一个空间调整的投影测量方法，通过消除了打扰SPT的投影测量来消除对SUBLATTICE的对称性拓扑（SPT）阶段。我们进一步研究了相变的临界特性，并发现它具有与二维渗透转变相同的临界指数。
Topological phase transition induced by spatially-tuned single-site measurement is investigated in a measurement-only circuit, in which three different types of projective measurement operator. Specific spatial setting and combination of commutation relations among three measurement operators generate such a transition. In practice, symmetry protected topological (SPT) phase is recovered on even sublattice by eliminating a projective measurement disturbing the SPT via applying another spatially-tuned projective measurement on odd sublattice. We further investigate the critical properties of the phase transition and find that it has the same critical exponents with the two-dimensional percolation transition.
