论文标题

过度阳光从熟悉的纳米插座发出

Overbias Light Emission From Memristive Nanojunctions

论文作者

Hamdad, S., Malchow, K., Dujardin, E., Bouhelier, A., Cheng, B., Zellweger, T., Leuthold, J.

论文摘要

在两个金属电极之间夹紧的纳米级介电间隙可能会在施加电应力时从绝缘变为高度导电的巨大阻力。这种突然的电阻切换效果在很大程度上被大量利用,用于模仿神经形态神经网络中的突触。在这里,我们表明电阻开关可以伴随着跨越可见光谱区域的电磁辐射的释放。重要的是,我们发现频谱的特征是光子能超过开关电压提供的电子的最大动能。这种所谓的过度逐渐发射可以通过热辐射模型来形容,该热辐射模型具有在设备中产生的不平衡电子分布,其有效温度超过2000〜K。发射光谱是从辐射衰减到纳米级\ ch {sio2}矩阵中的谐振光学模式的热电子来理解的,位于两个\ ch {ag}电极之间。电阻开关与原子尺度光子备忘录中过度发射的发作之间的相关性带来了新的场所,以在光学互连中产生芯片的照明及其剥削。还可以监视在回忆开关期间发出的光子,以遵循基于Memristor的网络中的神经激活途径。

A nanoscale dielectric gap clamped between two metal electrodes may undergo a large resistance change from insulating to highly conducting upon applying an electrical stress. This sudden resistive switching effect is largely exploited in memristors for emulating synapses in neuromorphic neural networks. Here, we show that resistive switching can be accompanied by a release of electromagnetic radiation spanning the visible spectral region. Importantly, we find that the spectrum is characterized by photon energies exceeding the maximum kinetic energy of electrons provided by the switching voltage. This so-called overbias emission can be described self-consistently by a thermal radiation model featuring an out-of-equilibrium electron distribution generated in the device with an effective temperature exceeding 2000~K. The emitted spectrum is understood in terms of hot electrons radiatively decaying to resonant optical modes occurring in a nanoscale \ch{SiO2} matrix located between two \ch{Ag} electrodes. The correlation between resistive switching and the onset of overbias emission in atomic-scale photonic memristor brings new venues to generate light on chip and their exploitation in optical interconnects. Photons emitted during memristive switching can also be monitored to follow the neural activation pathways in memristor-based networks.

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