论文标题

使用基于Pixel-Pattern的激光激发和光热分辨率重建对内部缺陷的无损热力学检测

Nondestructive thermographic detection of internal defects using pixel-pattern based laser excitation and photothermal super resolution reconstruction

论文作者

Lecompagnon, Julien, Hirsch, Philipp Daniel, Rupprecht, Christian, Ziegler, Mathias

论文摘要

在这项工作中,我们提出了一种新的方法,用于使用基于二维像素模式的基于二维像素模式的活性光热激光加热的内部缺陷的热量表分辨率,并结合随后的数值重建,以实现内部缺陷结构的高分辨率重建。通过提议采用使用激光耦合的高功率DLP投影仪技术生成的像素化模式,可以大大降低实现真正的二维超级分辨率的复杂性,从而迈出至关重要的一步。此外,根据高功率DLP投影仪的最新发展,我们介绍了他们的首个宏观金属样品的结构化脉冲脉冲检查的应用。此外,提出了针对基础问题的远期解决方案以及适当的启发式方法,以找到实验室环境中数值反转所需的正则化参数。这允许生成合成测量数据,为应用基于机器学习的方法开辟了大门,以将来改进该方法的充分自动化。最后,与当前可用的光热超级分辨率技术相比,所提出的方法经过实验验证,并显示出胜过几种已建立的常规热力计测试技术,同时保守地将所需的测量时间提高了8倍。

In this work, we present a novel approach to photothermal super resolution based thermographic resolution of internal defects using two-dimensional pixel pattern-based active photothermal laser heating in conjunction with subsequent numerical reconstruction to achieve a high-resolution reconstruction of internal defect structures. With the proposed adoption of pixelated patterns generated using laser coupled high-power DLP projector technology the complexity for achieving true two-dimensional super resolution can be dramatically reduced taking a crucial step forward towards widespread practical viability. Furthermore, based on the latest developments in high-power DLP projectors, we present their first application for structured pulsed thermographic inspection of macroscopic metal samples. In addition, a forward solution to the underlying inverse problem is proposed along with an appropriate heuristic to find the regularization parameters necessary for the numerical inversion in a laboratory setting. This allows the generation of synthetic measurement data, opening the door for the application of machine learning based methods for future improvements towards full automation of the method. Finally, the proposed method is experimentally validated and shown to outperform several established conventional thermographic testing techniques while conservatively improving the required measurement times by a factor of 8 compared to currently available photothermal super resolution techniques.

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