论文标题
用阶梯阻抗标准在多行校准中验证参考阻抗
Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards
论文作者
论文摘要
本文提出了一种新技术，用于评估多行反射线（TRL）校准中参考阻抗的一致性。在校准过程中，假定所有传输线标准都具有相同的特征阻抗。但是，这些假设容易因缺陷而导致错误，这可能会影响校准后参考阻抗的有效性。我们提出的方法涉及使用不同长度的多个阶梯阻抗线来提取阻抗转变的宽带反射系数。该反射系数可用于实验验证参考阻抗，而无需完全定义的标准。我们使用基于磁盘探测设置的印刷电路板（PCB）上的微带结构（PCB）上的微带结构来证明这种方法。
This paper presents a new technique for evaluating the consistency of the reference impedance in multiline thru-reflect-line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup.
