论文标题

使用光的旋转式效应对超薄原子层的高敏性表征

High-Sensitivity Characterization of Ultra-Thin Atomic Layers using Spin-Hall Effect of Light

论文作者

Panda, Janmey Jay, Sahoo, Krishna Rani, Praturi, Aparna, Lal, Ashique, Viswanathan, Nirmal K., Narayanan, Tharangattu N., Rajalakshmi, G.

论文摘要

由于此类膜的各种应用,磁性/非磁性/异质结构超薄膜的表征高度要求。通常在此类系统上进行多种测量,以推断其电气,光学和磁性。我们证明了基于摩托的光(SHEL)是一种用于研究材料的磁性和介电秩序的多功能表面表征工具。使用此技术,我们测量了磁场依赖性复合物角和粘合色(PY)的超薄薄膜和二咪二硫代钼(MOS $ _2 $)的固体性 - Permalloy(MSPY)杂合结构接口。将测量值与标准磁光KERR效应(MOKE)研究进行了比较,以证明Shel-Moke是具有竞争敏感性的常规Moke方法的实际替代方法。提供了全面的理论模型和仿真数据,以进一步增强这种简单的非侵入性光学方法的潜力。理论模型用于提取非磁性超薄层(例如MOS $ _2 $)的光电性和敏感性。

Magnetic/non-magnetic/heterostructured ultra-thin films' characterisation is highly demanding due to the emerging diverse applications of such films. Diverse measurements are usually performed on such systems to infer their electrical, optical and magnetic properties. We demonstrate that MOKE-based spin-Hall effect of light (SHEL) is a versatile surface characterization tool for studying materials' magnetic and dielectric ordering. Using this technique, we measure magnetic field dependent complex Kerr angle and the coercivity in ultra-thin films of permalloy (Py) and at molybdenum disulphide (MoS$_2$) - permalloy (MSPy) hetero-structure interfaces. The measurements are compared with standard magneto-optic Kerr effect (MOKE) studies to demonstrate that SHEL-MOKE is a practical alternative to the conventional MOKE method, with competitive sensitivity. A comprehensive theoretical model and simulation data are provided to further strengthen the potential of this simple non-invasive optical method. The theoretical model is applied to extract the optical conductivity and susceptibility of non-magnetic ultra-thin layers such as MoS$_2$ .

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