论文标题

使用Kirkpatrick-Baez Mirror Optics开发多功能微焦点的角度分辨光谱系统

Development of a versatile micro-focused angle-resolved photoemission spectroscopy system with Kirkpatrick-Baez mirror optics

论文作者

Kitamura, Miho, Souma, Seigo, Honma, Asuka, Wakabayashi, Daisuke, Tanaka, Hirokazu, Toyoshima, Akio, Amemiya, Kenta, Kawakami, Tappei, Sugawara, Katsuaki, Nakayama, Kosuke, Yoshimatsu, Kohei, Kumigashira, Hiroshi, Sato, Takafumi, Horiba, Koji

论文摘要

使用微焦点梁斑(微孔)的角度分辨光发射光谱正在成为阐明异国量子材料的关键电子状态的强大工具。我们已经开发了一种基于Kirkpatrick-Baez Mirror光学元件的同步加速器辐射光束,开发了一种多功能的微孔系统。镜子是单层安装在舞台上的,该阶段是由五轴运动驱动的,并与ARPES测量系统分开。 SI上的Auphotolography模式的空间映射表示,梁斑点大小为10 $ $ m(水平)x 12 $μ$ m(垂直)的样品位置,这非常适合解决本地电子状态的良好结构。微光束和高精度样品运动系统的利用实现了准确的空间分辨的带结构映射,如观察到与裂解拓扑绝缘子单晶边缘附近的小带异常相关的小带异常所证明的。

Angle-resolved photoemission spectroscopy using a micro-focused beam spot (micro-ARPES) is becoming a powerful tool to elucidate key electronic states of exotic quantum materials. We have developed a versatile micro-ARPES system based on synchrotron radiation beam focused with a Kirkpatrick-Baez mirror optics. The mirrors are monolithically installed on a stage, which is driven with five-axes motion, and are vibrationally separated from the ARPES measurement system. Spatial mapping of the Auphotolithography pattern on Si signifies the beam spot size of 10 $μ$m (horizontal) x 12 $μ$m (vertical) at the sample position, which is well suited to resolve the fine structure in local electronic states. Utilization of the micro beam and the high precision sample motion system enables the accurate spatially resolved band-structure mapping, as demonstrated by the observation of a small band anomaly associated with tiny sample bending near the edge of a cleaved topological insulator single crystal.

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