论文标题

DASP:缺陷和掺杂剂AB-Initio仿真软件包

DASP: Defect and Dopant ab-initio Simulation Package

论文作者

Huang, Menglin, Zheng, Zhengneng, Dai, Zhenxing, Guo, Xinjing, Wang, Shanshan, Jiang, Lilai, Wei, Jinchen, Chen, Shiyou

论文摘要

In order to perform automated calculations of defect and dopant properties in semiconductors and insulators, we developed a software package, Defect and Dopant ab-initio Simulation Package (DASP), which is composed of four modules for calculating: (i) elemental chemical potentials, (ii) defect (dopant) formation energies and transition energy levels, (iii) defect and carrier densities and (iv) carrier dynamics高密度缺陷的特性。当计算稳定化合物半导体的元素化学电位时,DASP使用材料基因组数据库快速确定竞争次级阶段和计算凸壳上方的能量,因此它可以对多元化合物热力学稳定性进行高通量预测。 DASP调用AB-Initio软件以执行具有不同结构构型和电荷状态的缺陷超电池的总能量,结构弛豫和电子结构计算,基于这些缺陷形成能和过渡能量水平,并且可以包括静电势比对和图像电荷相互作用的校正。然后,DASP可以计算出在不同的化学潜力条件和不同的生长/工作温度下的缺陷,电子和孔载体的平衡密度以及半导体中的费米水平。对于高密度缺陷,DASP可以计算载体动力学特性,例如光致发光(PL)光谱,与缺陷相关的辐射和非辐射载体捕获横截面,以及非平衡载体的重组寿命。

In order to perform automated calculations of defect and dopant properties in semiconductors and insulators, we developed a software package, Defect and Dopant ab-initio Simulation Package (DASP), which is composed of four modules for calculating: (i) elemental chemical potentials, (ii) defect (dopant) formation energies and transition energy levels, (iii) defect and carrier densities and (iv) carrier dynamics properties of high-density defects. DASP uses the materials genome database for quick determination of competing secondary phases and calculation of the energy above convex hull when calculating the elemental chemical potential that stabilizes compound semiconductors, so it can perform high-throughput prediction of thermodynamic stability of multinary compounds. DASP calls the ab-initio softwares to perform the total energy, structural relaxation and electronic structure calculations of the defect supercells with different structure configurations and charge states, based on which the defect formation energies and transition energy levels are calculated and the corrections for electrostatic potential alignment and image charge interaction can be included. Then DASP can calculate the equilibrium densities of defects and electron and hole carriers as well as the Fermi level in semiconductors under different chemical potential conditions and different growth/working temperature. For high-density defects, DASP can calculate the carrier dynamics properties such as the photoluminescence (PL) spectrum, defect-related radiative and non-radiative carrier capture cross sections, and recombination lifetime of non-equilibrium carriers.

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