论文标题
JWST Miri Si的掩埋接触的光学特性的表征：红外阻断杂质探测器
Characterization of the optical properties of the buried contact of the JWST MIRI Si:As infrared blocked impurity band detectors
论文作者
论文摘要
詹姆斯·韦伯（James Webb）太空望远镜在板上的中红外仪器Miri使用三个SI：作为杂质带传导探测器阵列。 Miri中等分辨率光谱测量（R $ \ SIM $ 3500-1500）在5〜 $μm$ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $波长范围内显示了光谱基线的10-30 \％调制； Si中红外光的相干反射：由于检测器阵列会导致边缘。我们量化了条纹对地面测试过程中用Miri观察到的光源光谱的形状和影响，并开发了光学模型以模拟观察到的调制。我们将光学模型与Miri光谱数据结合使用，以表明Miri Si内部掩埋接触的性质：因为检测器对流口行为具有显着影响。
The Mid-Infrared Instrument MIRI on-board the James Webb Space Telescope uses three Si:As impurity band conduction detector arrays. MIRI medium resolution spectroscopic measurements (R$\sim$3500-1500) in the 5~$μm$ to 28~$μm$ wavelength range show a 10-30\% modulation of the spectral baseline; coherent reflections of infrared light within the Si:As detector arrays result in fringing. We quantify the shape and impact of fringes on spectra of optical sources observed with MIRI during ground testing and develop an optical model to simulate the observed modulation. We use our optical model in conjunction with the MIRI spectroscopic data to show that the properties of the buried contact inside the MIRI Si:As detector have a significant effect on the fringing behavior.
