论文标题
在IBM量子设备上测试基于标志的故障耐受性
Testing of flag-based fault-tolerance on IBM quantum devices
论文作者
论文摘要
很难在NISQ设备上实现理论量子优势。除了尝试减少误差和动态解耦的尝试减少误差外，还提出了减少传统方案的高开销的小量子误差校正和耐故障方案。根据最新的容错性进步，可以使用标志最大程度地减少辅助量子尺的数量。尽管实施这些计划仍然是不可能的，但值得弥合NISQ时代与FTQC时代之间的差距。在这里，我们介绍了一种基准测试方法，以测试NISQ设备上[[5,1,3]]代码的标志的标志，以测试易于故障的量子误差校正。基于使用IBM的QASM模拟器及其15 Quit墨尔本处理器获得的结果，我们表明该标记的方案可以在NISQ设备上测试，通过检查中间状态在存在噪声的情况下与预期状态的子空间与预期状态重叠的程度。
It is hard to achieve a theoretical quantum advantage on NISQ devices. Besides the attempts to reduce error using error mitigation and dynamical decoupling, small quantum error correction and fault-tolerant schemes that reduce the high overhead of traditional schemes have also been proposed. According to the recent advancements in fault tolerance, it is possible to minimize the number of ancillary qubits using flags. While implementing those schemes is still impossible, it is worthwhile to bridge the gap between the NISQ era and the FTQC era. Here, we introduce a benchmarking method to test fault-tolerant quantum error correction with flags for the [[5,1,3]] code on NISQ devices. Based on results obtained using IBM's qasm simulator and its 15-qubit Melbourne processor, we show that this flagged scheme is testable on NISQ devices by checking how much the subspace of intermediate state overlaps with the expected state in the presence of noise.
