论文标题
磁圆二色性的电检测：在超薄铁磁膜中应用于磁显微镜
Electrical detection of magnetic circular dichroism: application to magnetic microscopy in ultra-thin ferromagnetic films
论文作者
论文摘要
成像薄膜的磁构型已经是研究的长期研究领域。自几年以来，二维铁磁材料的出现要求在磁成像领域进行创新。由于磁矩非常小，因此标准技术（如鱿鱼，扭矩磁力测定法，磁力显微镜和KERR效应显微镜）具有挑战性，并且通常导致检测到寄生磁贡献或虚假效应。在这项工作中，我们报告了一种新的磁显微镜技术，基于半导体/铁磁性双层中的磁性圆形二色性和Seebeck效应的组合。我们用垂直磁化（CO/PT）多层溅射在GE（111）上实现此方法。我们进一步表明，MCD的电检测比Kerr磁力测定法更敏感，尤其是在超薄膜状态下，这使得研究起新兴的二维铁磁材料特别有希望。
Imaging the magnetic configuration of thin-films has been a long-standing area of research. Since a few years, the emergence of two-dimensional ferromagnetic materials calls for innovation in the field of magnetic imaging. As the magnetic moments are extremely small, standard techniques like SQUID, torque magnetometry, magnetic force microscopy and Kerr effect microscopy are challenging and often lead to the detection of parasitic magnetic contributions or spurious effects. In this work, we report a new magnetic microscopy technique based on the combination of magnetic circular dichroism and Seebeck effect in semiconductor/ferromagnet bilayers. We implement this method with perpendicularly magnetized (Co/Pt) multilayers sputtered on Ge (111). We further show that the electrical detection of MCD is more sensitive than the Kerr magnetometry, especially in the ultra-thin film regime, which makes it particularly promising for the study of emergent two-dimensional ferromagnetic materials.
