论文标题
认证的量子门
Certified quantum gates
论文作者
论文摘要
高质量，完全可编程的量子处理器可提供少量量子位（<1000），并且这些近期机器的科学潜力尚不清楚。如果少量物理量子位排除了实际的量子误差校正，则如何使用这些可易碰撞的处理器来执行有用的任务？我们提出了一种为某些使用其他内部状态而不需要其他物理量子的量子错误检测开发量子错误检测的策略。为被困离子平台中的通用门设置提供了添加错误检测的示例。错误检测可用于通过某些错误来证明单个门操作，并且检测的不可逆性允许在末尾检查复杂计算的结果是否有错误标志。
High quality, fully-programmable quantum processors are available with small numbers (<1000) of qubits, and the scientific potential of these near term machines is not well understood. If the small number of physical qubits precludes practical quantum error correction, how can these error-susceptible processors be used to perform useful tasks? We present a strategy for developing quantum error detection for certain gate imperfections that utilizes additional internal states and does not require additional physical qubits. Examples for adding error detection are provided for a universal gate set in the trapped ion platform. Error detection can be used to certify individual gate operations against certain errors, and the irreversible nature of the detection allows a result of a complex computation to be checked at the end for error flags.
