论文标题

高亮度在子微米的高亮度激光,由无下垂的鳍发光二极管启用

High Brightness Lasing at Sub-micron Enabled by Droop-Free Fin Light-Emitting Diodes

论文作者

Nikoobakht, Babak, Hansen, Robin P., Zong, Yuqin, Agrawal, Amit, Shur, Michael, Tersoff, Jerry

论文摘要

效率下垂,即在高电流下LED的亮度下降,限制了所有市售LED的性能。到目前为止,它已经将亚微米LED和激光器的输出功率限制在纳米瓦特范围内。在这里,我们提出了一个FIN P-N连接LED像素,可消除效率下垂,从而使LED亮度随着注入的电流而线性增加。记录的当前密度为1000 ka/cm2(100 mA),LED在鳍片内的LED过渡,具有较高的亮度。尽管轻萃取效率仅为15%,但这些设备超过了任何以前的电气驱动的亚微米LED或激光像素的输出功率100至1000倍,同时显示出可比的外部量子效率。建模表明,在高注射水平下,电子孔重组区域的扩散会抑制非辐射性螺旋螺旋体的重组过程。预计该设计的进一步完善将使新一代高亮度电气可寻址的LED和激光像素用于宏观和微尺度应用。

Efficiency droop, i.e., a decline in brightness of LEDs at high electrical currents, has limited the performance of all commercially available LEDs. Until now, it has limited the output power of sub-micron LEDs and lasers to nanowatt range. Here we present a fin p-n junction LED pixel that eliminates efficiency droop, allowing LEDs brightness to increase linearly with injected current. With record current densities of 1000 KA/cm2 (100 mA), the LEDs transition to lasing within the fin, with high brightness. Despite a light extraction efficiency of only 15%, these devices exceed the output power of any previous electrically-driven sub-micron LED or laser pixel by 100 to 1000 times, while showing comparable external quantum efficiencies. Modeling suggests that spreading of the electron-hole recombination region in fin LEDs at high injection levels suppresses the non-radiative Auger recombination processes. Further refinement of this design is expected to enable development of a new generation of high brightness electrically addressable LED and laser pixels for macro- and micro-scale applications.

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