论文标题
122 Sensl MicroFJ-60035 SIPMS的校准和由于耦合的轻轨而导致光学串扰的降低
Calibration of 122 SensL MicroFJ-60035 SiPMs and the reduction of optical crosstalk due to coupled light guides
论文作者
论文摘要
最近几代硅光电层流(SIPM)的出色生产质量允许在不单独校准故障电压的情况下运行。提出了串扰概率和122型Sensl MicroFJ-60035-TSV类型的相对增益的测量值。半导体照片传感器已在许多应用程序中取代了带有单光子分辨率,对磁场不敏感的应用,较高的鲁棒性和增强的照片检测效率在较低的运行电压和较低成本下的增强的照片。轻轨用于增加相对小的sipms敏感面积。它们的光学耦合改变了传感器的表面条件,并影响串扰光子离开传感器而不会诱导次级崩溃的概率。这项研究比较了传感器的性能,这些传感器在光学上与裸传感器的光导向器的特性进行了比较,该传感器在标称偏置电压下运行。它表明,与光导向的光学耦合显着降低了测量传感器的串扰概率。
The excellent production quality of recent generations of Silicon Photomultipliers (SiPMs) allows for operation without individual calibration of the breakdown voltage. Measurements of the crosstalk probability and the relative gain of 122 SiPMs of type SensL MicroFJ-60035-TSV are presented. Semi-conductor photo sensors have replaced photo multiplier tubes in numerous applications featuring single-photon resolution, insensitivity to magnetic fields, higher robustness and enhanced photo detection efficiency at lower operation voltage and lower costs. Light guides are used to increase the comparably small photo sensitive area of SiPMs. Their optical coupling changes the surface conditions of the sensor and influences the probability for crosstalk photons to leave the sensor without inducing secondary breakdowns. This study compares properties of sensors that are optically coupled to light guides with bare sensors, operated at nominal bias voltage. It demonstrates, that the optical coupling to a light guide significantly reduces the crosstalk probability of the measured sensors.