论文标题
薄合金膜中的电子移民引导的组成模式：一项计算研究
Electromigration-guided composition patterns in thin alloy films: a computational study
论文作者
论文摘要
通过计算扩散和电气移动的连续动力学模型，本文证明了指导在晶体合金膜的薄表面层中指导条纹组成模式的可行性。通过采用系统的参数计算分析，可以揭示出诸如条纹的空气数密度和条纹的模式的特性如何受到不限于电场强度及其在平面中的电场强度及其方向角的主要物理因素的影响，但还包括在特定晶体中扩散的许多参数，包括许多参数。通过遵循此分析的见解，希望可以在专门的实验中创建实际模式。
Via computation of a continuum dynamical model of the diffusion and electromigration, this paper demonstrates the feasibility of guiding the formation of the stripe composition patterns in the thin surface layers of the crystal alloy films. By employing the systematic parametric computational analysis it is revealed how such properties of the pattern as the aerial number density of the stripes and the stripe in-plane orientation are influenced by the major physical factors that are not limited to the electric field strength and its direction angle in the plane, but also include a number of parameters that originate in the anisotropy of diffusion in the particular crystallographically-oriented surface layer. By following the insights from this analysis the real patterns hopefully can be created in a dedicated experiment.
