lux检测器中背景电子排放的研究

论文标题

lux检测器中背景电子排放的研究

Investigation of background electron emission in the LUX detector

论文作者

Akerib, D. S., Alsum, S., Araújo, H. M., Bai, X., Balajthy, J., Baxter, A., Bernard, E. P., Bernstein, A., Biesiadzinski, T. P., Boulton, E. M., Boxer, B., Brás, P., Burdin, S., Byram, D., Carmona-Benitez, M. C., Chan, C., Cutter, J. E., de Viveiros, L., Druszkiewicz, E., Fan, A., Fiorucci, S., Gaitskell, R. J., Ghag, C., Gilchriese, M. G. D., Gwilliam, C., Hall, C. R., Haselschwardt, S. J., Hertel, S. A., Hogan, D. P., Horn, M., Huang, D. Q., Ignarra, C. M., Jacobsen, R. G., Jahangir, O., Ji, W., Kamdin, K., Kazkaz, K., Khaitan, D., Korolkova, E. V., Kravitz, S., Kudryavtsev, V. A., Leason, E., Lenardo, B. G., Lesko, K. T., Liao, J., Lin, J., Lindote, A., Lopes, M. I., Manalaysay, A., Mannino, R. L., Marangou, N., McKinsey, D. N., Mei, D. M., Moongweluwan, M., Morad, J. A., Murphy, A. St. J., Naylor, A., Nehrkorn, C., Nelson, H. N., Neves, F., Nilima, A., Oliver-Mallory, K. C., Palladino, K. J., Pease, E. K., Riffard, Q., Rischbieter, G. R. C., Rhyne, C., Rossiter, P., Shaw, S., Shutt, T. A., Silva, C., Solmaz, M., Solovov, V. N., Sorensen, P., Sumner, T. J., Szydagis, M., Taylor, D. J., Taylor, R., Taylor, W. C., Tennyson, B. P., Terman, P. A., Tiedt, D. R., To, W. H., Tvrznikova, L., Utku, U., Uvarov, S., Vacheret, A., Velan, V., Webb, R. C., White, J. T., Whitis, T. J., Witherell, M. S., Wolfs, F. L. H., Woodward, D., Xu, J., Zhang, C.

论文摘要

目前在直接检测暗物质实验中使用的双相氙气检测器已经观察到低能区域中背景电子事件的速率升高。尽管这种背景以各种方式对检测器的性能产生负面影响，但仅研究了其起源。在本文中，我们报告了对Lux暗物质实验中观察到的电子病理的系统研究。我们根据其发射强度及其与检测器中的能量沉积的相关性来表征不同的电子种群。通过研究不同的实验条件下的背景，我们确定了领先的发射机制，包括光电离和氙发光引起的光电效应，被困在液体表面下的电子的延迟发射，通过杂质捕获和释放电子电子，以及网格电子发射。我们讨论如何在基于勒克斯和未来的氙气暗物质实验中减轻这些背景。

Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.

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