论文标题

使用支持向量回归的挑选和位置过程中组件变化的预测

Prediction of Component Shifts in Pick and Place Process of Surface Mount Technology Using Support Vector Regression

论文作者

Cao, Shun, Parviziomran, Irandokht, Yang, Haeyong, Park, Seungbae, Won, Daehan

论文摘要

在表面安装技术(SMT)的Pick and Plote(P&P)过程中,放置的组件可以从其理想(或设计)在湿焊料上的位置转移。具有一些流体特性的焊料糊状物可能会衰退,并且焊料不同侧面之间的不平衡也会导致组件上的其他力。尽管通常认为这些转变可以忽略不计,并且可以在焊接过程中通过以下自调和在一定程度上可以弥补,但应引起人们的注意,因为它对于解决SMT中印刷电路板(PCB)的质量的重要性。为了最大程度地减少或控制组件变化,应最初研究其与焊料糊的特性(例如,偏移,体积)的关系。在本文中,我们设计了一个全面的实验,并从最先进的SMT装配线中收集数据。然后,我们使用支持向量回归(SVR)模型来根据焊料糊和放置设置的不同情况来预测组件变化。此外,还采用了两个内核函数,即线性(SVR线性)和径向基函数(SVR-RBF)。所达到的结果表明,P&P过程中的组件变化很重要,并且SVR模型高度有资格用于对组件变化的预测。特别是,考虑到预测误差,SVR-RBF模型的表现优于SVR线性模型。

In pick and place (P&P) process of surface mount technology (SMT) the placed component can shift from its ideal (or designed) position on the wet solder paste. The solder paste with some fluid properties could slump and the unbalance between different sides of solder paste can lead to other forces on the components as well. Though the shifts are usually considered to be negligible and can be made up to some extent by the following self-alignment during the process of soldering reflow, it should be attracted attention as its importance for addressing the quality of the printed circuit board (PCB) in SMT. To minimize or control the component shifts, whose relationship with the characteristics of the solder paste (e.g., offset, volume) should be studied initially. In this paper, we design a comprehensive experiment and collect the data from a state-of-the-art SMT assembly line. Then we use support vector regression (SVR) model to predict the component shifts based on different situations of solder paste and placement settings. Also, two kernel functions, linear (SVR-Linear) and radial basis function (SVR-RBF), are employed. The achieved results indicate that the component shift in P&P process is significant, and the SVR model is highly qualified for the forecast of the component shifts. Particularly, the SVR-RBF model outperforms the SVR-Linear model considering the prediction error.

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